Test socket for an integrated circuit

Details Test socket for an integrated circuit Test socket for an integrated circuit

2007-12-11

2007-12-11

Nguyen, Vinh P. (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S755090

Reexamination Certificate

active

11601609

ABSTRACT:
A test socket for an integrated circuit, wherein the test socket has a first plurality of test points for making electrical contact with contacts of a laminate package and a second plurality of test points for making electrical contact with contacts of a lead frame package. The test socket is suitable for testing, at one time: a laminate package, or a lead frame package, or both a laminate package and a lead frame package.

REFERENCES:
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patent: 5923179 (1999-07-01), Taylor
patent: 6380752 (2002-04-01), Irino
patent: 2003/0040139 (2003-02-01), Canella
patent: 2004/0174176 (2004-09-01), Kirby
patent: 08-069855 (1996-03-01), None
patent: 08220188 (1996-08-01), None
patent: 08-271578 (1996-10-01), None
patent: 2001-006832 (2001-01-01), None

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