Test socket for an IC device

Details Test socket for an IC device Test socket for an IC device

1995-10-04

2000-04-04

Karlsen, Ernest

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

324761, G01R 1073

Patent

active

060465972

ABSTRACT:
A test socket for an IC device has relatively thin contact interface wall having an array of double-ended pogo pins. The double-ended pogo pins provide resilient spring-loaded contacts for the I/O contacts of an IC device held in the socket as well as for the circuit contacts of a PC board to which the socket is mounted.

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