Test socket for an electronic assembly which reduces damage...

Details Test socket for an electronic assembly which reduces damage... Test socket for an electronic assembly which reduces damage...

2000-08-22

2002-09-10

Patel, Tulsidas (Department: 2839)

Electrical connectors

With coupling movement-actuating means or retaining means in...

For dual inline package

C361S709000, C361S718000

Reexamination Certificate

active

06447322

ABSTRACT:

BACKGROUND OF THE INVENTION
1). Field of the Invention
This invention relates to a test socket for an electronic assembly.
2). Discussion of Related Art
U.S. Pat. No. 5,865,639 describes a test socket that can be used for testing an electronic assembly. The test socket has a holder having a recess for receiving the electronic assembly. Heat sinks are pivotally secured to the holder and are biased from a loading position, wherein the electronic assembly can be located in the holder, to a testing position wherein the heat sinks contact a surface of an integrated circuit of the electronic assembly. The heat sinks have large mass and velocity, and therefore kinetic energy when they strike the integrated circuit. Impact forces created by the heat sinks on the integrated circuit often result in damage to the integrated circuit.


REFERENCES:
patent: 5493237 (1996-02-01), Volz et al.
patent: 5621615 (1997-04-01), Dawson et al.
patent: 5953212 (1999-09-01), Lee
patent: 5989039 (1999-11-01), Sik
patent: 6000125 (1999-12-01), Kang
patent: 6152744 (2000-11-01), Maeda
patent: 6219243 (2001-04-01), Ma et al.
patent: 6226185 (2001-05-01), Lin
patent: 6292369 (2001-09-01), Daves et al.

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