Electrical connectors – With coupling movement-actuating means or retaining means in... – For dual inline package
Reexamination Certificate
2006-10-03
2006-10-03
Abrams, Neil (Department: 2839)
Electrical connectors
With coupling movement-actuating means or retaining means in...
For dual inline package
C439S070000
Reexamination Certificate
active
07114976
ABSTRACT:
A test socket (52) for a semiconductor component (12) includes a base (54), a movable lid (56), socket contacts (68) for electrically engaging terminal contacts (14) on the component (12), and a retention mechanism (74) having latches (74) actuated by movement of the lid (56) for inward and outward movement during retention and release of the component (12). Such lid (56) and latch (74) movement provides a loading/unloading position, in which the component (12) can be loaded or unloaded, and then a testing position, in which the component (12) is retained by the retention mechanism (74) in electrical communication with the socket contacts (68). The test socket (52) also includes a nest (58) for aligning the component (12), which is configured for removal or installation in the testing position of the test socket (52) while the latches (74) are in the inward or retention position. To permit such removal, the nest (58) includes openings (84) in a support surface (82) so that the nest (58) can be removed even though the latches (74) are inwardly positioned.
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Abrams Neil
Gratton Stephen A.
Micro)n Technology, Inc.
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