Test socket and method for failure analysis of plastic quad flat

Details Test socket and method for failure analysis of plastic quad flat Test socket and method for failure analysis of plastic quad flat

1991-07-31

1992-10-27

Nguyen, Vinh

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

324158P, 437 8, 439 70, G01R 106, H01R 13629

Patent

active

051592665

ABSTRACT:
A test socket and a method is provided for mounting and testing a quad flat pack QFP integrated-circuit package, where the QFP package has its leads cut to extend a predetermined distance from the sidewalls of the QFP integrated circuit package. The test socket includes a base to which are mounted a number of resilient contact blades having contacts for contacting the cut leads of the QFP device. A number of tester connection pins are mounted in the base and are connected to the contact blades. A movable comb member spaces the contact blades apart and is adjustably positioned to urge the contact blades into contact with the cut leads of a QFP device.

REFERENCES:
patent: Re28064 (1974-07-01), Venaleck et al.
patent: 4574235 (1986-03-01), Kelly et al.
patent: 4749362 (1988-06-01), Hoffman et al.
patent: 4768972 (1988-09-01), Ignasiak et al.
patent: 4835469 (1989-05-01), Jones et al.
patent: 5105149 (1992-04-01), Tokura

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