Test socket adjustable to solid state image pickup devices...

Details Test socket adjustable to solid state image pickup devices... Test socket adjustable to solid state image pickup devices...

2008-09-04

2009-10-27

Prasad, Chandrika (Department: 2839)

Electrical connectors

With coupling movement-actuating means or retaining means in...

For dual inline package

Reexamination Certificate

active

07607931

ABSTRACT:
Provided is a test socket capable of being used more flexibly for solid-state image pickup devices of different shapes and of performing locating of the solid-state image pickup devices more precisely. The test socket houses a device under test (DUT) which is a solid-state image pickup device while a test is being performed. The test socket comprises: first locating means for locating the DUT in an X direction parallel to a ceiling plane of the DUT in a housed state; urging means for urging the first locating means in a Z direction perpendicular to the ceiling plane of the DUT in the housed state; and position setting means for setting an upper limit of movement in the Z direction of the first locating means caused by the urging means to set a position in the Z direction of the first locating means relative to the DUT.

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