Test signal output circuit in LSI

Details Test signal output circuit in LSI Test signal output circuit in LSI

1993-03-03

1995-11-07

Canney, Vincent P.

Excavating

371 226, G01R 3128

Patent

active

054652570

ABSTRACT:
An object of the present invention is to reduce the number of external connection terminals of an LSI that are required for performing testing in an operating state. The test signal output circuit of the present invention comprises one or more test signal output terminals, one or more test mode signal input terminals, a decoder for interpreting signals from the test mode signal input terminals, and one or more selectors for selecting internal signals in response to the output of the decoder and outputting the selected signals from the respective test signal output terminal.

REFERENCES:
patent: 5077740 (1991-12-01), Kanuma
Structured Computer Organization Third Edition by Andrew S. Tanenbaum .COPYRGT.1990 by Prentice-Hall Inc. pp. 162-178.
Daniel P. Siewiorek et al. "Computer Structures: Principles and Examples" McGraw Hill, New York, 1982 pp. 588, 635-637.
Intel Corporation, i860.TM. 64-Bit Microprocessor, Oct. 1989.

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