Test signal output circuit for LSI

Details Test signal output circuit for LSI Test signal output circuit for LSI

1992-03-27

1995-01-03

Atkinson, Charles E.

Excavating

371 221, G01R 3128, H04B 1700

Patent

active

053793005

ABSTRACT:
A test signal output circuit comprising a decoder for decoding test-mode signals from test-mode signal input terminals, and selectors each for, in response to the output of this decoder, selecting specified ones of internal signals of the LSI, and outputting them at the test signal output terminals.
In virtue of this, tests of the LSI in operation can be performed substantially without increasing the number of external connection terminals of LSI.

REFERENCES:
patent: 4710927 (1987-12-01), Miller
patent: 4811299 (1989-03-01), Miyazawa et al.
patent: 5001713 (1991-03-01), Whetsel
patent: 5040150 (1991-08-01), Naiton et al.
patent: 5072447 (1991-12-01), Perloff et al.
patent: 5109190 (1992-04-01), Sakashita et al.
patent: 5144627 (1992-09-01), Horne et al.
patent: 5257267 (1993-10-01), Ishizaka

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