Test signal generator having timing calibration circuit

Details Test signal generator having timing calibration circuit Test signal generator having timing calibration circuit

1996-06-21

1998-01-27

Callahan, Timothy P.

Miscellaneous active electrical nonlinear devices, circuits, and

Signal converting, shaping, or generating

Synchronizing

327158, H03L 708

Patent

active

057125821

ABSTRACT:
A timing signal generator generates timing signals having a timing resolution higher than a reference clock signal and can measure a delay time in the timing signal generator with high accuracy by a loop oscillation method. The timing signal generator includes: a phase lock loop having a variable delay circuit which is formed of a plurality of delay elements connected in series wherein a delay time in the variable delay circuit is phase locked with a clock signal, a track hold circuit provided in the phase lock loop to transfer a phase lock control voltage to the phase lock loop in a phase lock mode and to temporarily hold the control voltage in a loop oscillation mode, a selector circuit to select a timing signal from a plurality of signals corresponding to the plurality of delay elements to produce the timing signal at a timing output, an input selector for selectively providing the clock signal to the phase lock loop during the phase lock mode and a returning pulse from the timing output during the loop oscillation mode, and a pulse injection circuit for starting an oscillation in the closed loop by injecting a pulse signal in the closed loop.

REFERENCES:
patent: 4680621 (1987-07-01), Baker et al.
patent: 4868514 (1989-09-01), Azevedo et al.
patent: 4908841 (1990-03-01), Leis et al.
patent: 5223755 (1993-06-01), Richley
patent: 5287025 (1994-02-01), Nishimichi
patent: 5307020 (1994-04-01), Marcuard
patent: 5428309 (1995-06-01), Yamauchi et al.
patent: 5491673 (1996-02-01), Okayasu
patent: 5557648 (1996-09-01), Ishihara

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