Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – With rotor
Patent
1989-05-23
1991-05-28
Wieder, Kenneth A.
Electricity: measuring and testing
Measuring, testing, or sensing electricity, per se
With rotor
324158T, 307362, 371 221, G01R 3128
Patent
active
050197720
ABSTRACT:
A test selection system is provided which includes a semiconductor substrate having a pin connected thereto and an integrated circuit disposed on the substrate and connected to the pin having an operating voltage within a given voltage range. A latch conditioning circuit having an input responsive to a voltage of a given magnitude has an output connected to a latch, and a voltage control circuit operable at a voltage without the given voltage range selectively applies a control voltage of the given magnitude to the input of the latch conditioning circuit. A voltage without the given voltage range is applied to the pin during a first interval of time to produce the control voltage for establishing a test mode and a voltage within the given voltage range is applied to the pin during a second interval of time to establish a normal operating mode for the integrated circuit.
REFERENCES:
patent: 4334307 (1982-06-01), Bourgeois et al.
patent: 4336495 (1982-06-01), Happe
patent: 4398146 (1983-08-01), Draheim et al.
patent: 4583179 (1986-04-01), Horii et al.
patent: 4612499 (1986-09-01), Andresen et al.
patent: 4691161 (1987-09-01), Kano et al.
patent: 4697140 (1987-09-01), Saito et al.
patent: 4714876 (1987-12-01), Gay et al.
patent: 4812680 (1989-03-01), Kawashima et al.
patent: 4833395 (1989-05-01), Sasaki et al.
patent: 4912709 (1990-03-01), Teske et al.
patent: 4914379 (1990-04-01), Maeno
JEDEC Solid State Products Engineering Council, Committee Ballot, dated Oct. 17, 1986, Subject and Background page and pp. 1 to 5.
Dreibelbis Jeffrey H.
Gabric John A.
Hedberg Erik L.
Burns William J.
International Business Machines - Corporation
Limanek Stephen J.
Wieder Kenneth A.
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