Optics: measuring and testing – Sample – specimen – or standard holder or support
Patent
1979-11-29
1982-02-02
Punter, William H.
Optics: measuring and testing
Sample, specimen, or standard holder or support
73 16, 219 1067, 356358, G01N 2101, G01B 1102, G01N 2516
Patent
active
043136796
ABSTRACT:
A test sample support assembly having its greatest utility in a length measuring device in a temperature controlled environment. The sample support assembly has a main support, a pair of insulating members and a sample support. In one embodiment of this invention the sample support is made of a substantially distortion-free material thereby precisely positioning the sample within the temperature controlled environment. In the other embodiment of this invention the sample support acts as the temperature controlling element. The sample support is adjustably mounted with respect to the main support. This adjustable feature permits corrective movement of the sample support to take place in order to compensate for the undesirable movement of the sample support.
REFERENCES:
patent: 3619463 (1971-11-01), Budlin et al.
patent: 3930730 (1976-01-01), Laurens et al.
patent: 3938889 (1976-02-01), McKinnis
Wolff et al., "Absolute Length Changes by Remote Interferometry", Samso-TR-75-284, 12-10-75.
Bloss, R. L., "An Extensometer for Use as a Laboratory Standard at Temperatures to 1500.degree. C.", ISA Trans., vol. 10, 1971, pp. 242-249.
Wolff et al., "Double Michelson Interferometer for Contactless Length Change Measurements", Samso-TR-78-136, 11-6-78.
Eselun Steven A.
Wolff Ernest G.
Erlich Jacob N.
Punter William H.
Singer Donald J.
The United States of America as represented by the Secretary of
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