Test probe for surface mounted leadless chip carrier

Details Test probe for surface mounted leadless chip carrier Test probe for surface mounted leadless chip carrier

1987-10-02

1989-05-23

Eisenzopf, Reinhard J.

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

324 73PC, 324158F, 439 54, G01R 106

Patent

active

048334049

ABSTRACT:
A test probe for a surface mounted leadless chip carrier is disclosed. The probed includes specially designed connector pins which allow size reductions in the probe. A thermoplastic housing provides spring action to ensure good mechanical and electrical contact between the pins and the contact strips of a leadless chip carrier. Other features include flexible wires molded into the housing and two different types of pins alternately placed in the housing. These features allow fabrication of a smaller and simpler test probe.

REFERENCES:
patent: 3506949 (1970-04-01), Venaleck et al.
patent: 4340858 (1982-07-01), Malloy
patent: 4340860 (1982-07-01), Teejde, Jr.
patent: 4476433 (1984-10-01), Logan
patent: 4516072 (1985-05-01), Marpoe, Jr.
patent: 4564251 (1986-01-01), Hansen et al.
patent: 4639058 (1987-01-01), Morgan
patent: 4675599 (1987-06-01), Jensen et al.
patent: 4705333 (1987-11-01), Sicard et al.
AP Products Catalog, Copyright 1985, p. 2.
AP Products, 3M, Data Sheets (2 Pages, Undated, Identified as Exhibits A and B).

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