Test probe for electrical measuring instruments, particularly fo

Details Test probe for electrical measuring instruments, particularly fo Test probe for electrical measuring instruments, particularly fo

1994-04-07

1996-04-30

Wieder, Kenneth A.

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

324757, 324725, 324508, 439482, G01R 3102

Patent

active

055128394

ABSTRACT:
The test probe for electrical measuring instruments, particularly for voltmeters, is characterized by an automatic holding device that automatically holds the test probe in a socket-outlet jack of any given design, which device comprises a contact spring at least partially adjacent to a contact pin and bilaterally bulging toward the tip of the contact pin. This results in a universally utilizable test probe that will hold automatically in any jack format of different socket-outlets, shock-hazard protection being ensured at all times.

REFERENCES:
patent: 2549731 (1944-12-01), Wattley
patent: 4263547 (1981-04-01), Johnson
patent: 4721903 (1988-01-01), Harsch
patent: 5285163 (1994-02-01), Liotta

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