Test probe for computer circuit board test fixture

Details Test probe for computer circuit board test fixture Test probe for computer circuit board test fixture

1997-01-21

1998-10-20

Abrams, Neil

Electrical connectors

Including handle or distinct manipulating means

Randomly manipulated implement

324761, G01R 1073

Patent

active

058238182

ABSTRACT:
An improved test probe for use with a bed of nails type test fixture is disclosed. The test probe comprises a probe body having a test head at one end for contacting test points on a DUT placed in a test fixture and an annular ring disposed around the circumference thereof proximate the center of the probe. A nonconductive tubular sheath is disposed over the test head and affixed at one end to the test probe by the annular ring. The other end of the sheath extends beyond the test head such that the test head is recessed within the sheath a distance defined by component lead length and PCB thickness fault tolerances and acceptable float. In this manner, the test probe enables the detection of PCB faults caused by missing or improperly or incorrectly inserted plated through-hole mounted components.

REFERENCES:
patent: 2567727 (1951-09-01), Quackenbush
patent: 5442299 (1995-08-01), Caggiano
patent: 5485096 (1996-01-01), Aksu
patent: 5493230 (1996-02-01), Swart et al.
patent: 5506510 (1996-04-01), Blumenau

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