Test probe assembly provides precise and repeatable contact forc

Details Test probe assembly provides precise and repeatable contact forc Test probe assembly provides precise and repeatable contact forc

1994-08-12

1995-12-05

Wieder, Kenneth A.

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

324754, 324757, 439482, G01R 3102

Patent

active

054732549

ABSTRACT:
A test fixture is provided for testing the resistance associated contamination material on the surface of electrical contacts mounted to a printed circuit board. An elongated probe is provided which has an axis perpendicular to X and Y planes. A mechanism is provided for maintaining the probe in a precise perpendicular orientation to the X and Y planes while permitting movement of the probe along its axis in the Z plane to engage an aligned contact. A predetermined bias force is exerted by the probe along its axis while engaging the contact to be tested.

REFERENCES:
patent: 4912400 (1990-03-01), Plante
patent: 5006793 (1991-04-01), Gleason et al.
patent: 5068600 (1991-11-01), Hilz et al.
patent: 5311119 (1994-05-01), Bullock et al.
"Ball Slides", TUSK catalog, p. 4, 1986.
"Measuring the Contact Resistance of Circuit Pack Connectors", Gary E. Kleindedler, The Engineer, Second Issue 1983, pp. 11-15.
"Air Cylinder, Series CJ2", SMC catalog E223-A, pp. 27-28, 36, 106, 1988.

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