Test probe assembly for testing integrated circuit devices

Details Test probe assembly for testing integrated circuit devices Test probe assembly for testing integrated circuit devices

1989-12-18

1990-12-04

Karlsen, Ernest F.

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

324 725, 324158F, G01R 106, G01R 3102

Patent

active

049756389

ABSTRACT:
A test probe assembly for testing an integrated circuit (IC) device having contact pads deployed in a predetermined pattern in a common plane. The assembly includes a contactor formed by a flexible film of dielectric material having a rectangular planar central zone from whose corners extend radial slots to define suspension quadrants. Probe contacts formed on the undersurface of the central zone in a matching pattern are connected to probe terminals on the margins of the quadrants. The quadrants are marginally supported on corresponding branches of a mounting frame whereby the central zone sags below the frame which surrounds a central port in a printed circuit board, the port exposing the central zone to the IC device to be tested.

REFERENCES:
patent: 4891585 (1990-01-01), Janko et al.
patent: 4912399 (1990-03-01), Greub et al.

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