Test probe assembly for microelectronic circuits

Details Test probe assembly for microelectronic circuits Test probe assembly for microelectronic circuits

1983-09-19

1986-10-21

Karlsen, Ernest F.

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

324 725, G01R 106, G01R 3102

Patent

active

046188215

ABSTRACT:
A test probe assembly for microelectronic circuits includes an electrically nonconductive support block, and at least one test probe of a flat metal stock, the test probe having an elongated body portion supported by the block and a probe tip with a flexed portion. The flexed portion has a flexing slot extending generally longitudinal with respect to the direction of the body portion, and defining two narrow, non-parallel flex means extending from the body portion to the probe tip. The flex beams and the flexing slot are dimensioned so that movement of the probe tip under stress toward the support block causes one of the beams to flex inwardly through the flexing slot and diminishes the distance between the two beams.

REFERENCES:
patent: 3560907 (1971-02-01), Heller
patent: 3611128 (1971-10-01), Nagata

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