Test probe apparatus

Details Test probe apparatus Test probe apparatus

1989-05-08

1990-02-27

McGlynn, Joseph H.

Electrical connectors

With coupling movement-actuating means or retaining means in...

Retaining means

H01R 13639

Patent

active

049042009

ABSTRACT:
The test probe is formed by a tubular body member carrying electrical contacts at its front end. Latching members are pivotally coupled to the front end of the body member. Each latching member has a latching portion located rearwardly of the pivot point of the latching member. The latching portions have exterior threads for engaging the interior threads of a tested device opening. The latching members are located in a space between the body member and a shell. The shell has openings for receiving the latching portions. A movable sleeve located around the body member can move forward and rearward relative to the body member. The sleeve has openings for receiving the latching members, a front radial wall for contacting the latching members, and a tapered surface for receiving a spring. In the forward position of the sleeve, the spring forces the latching members outwardly for latching purposes. In the rearward position of the sleeve, the radial wall of the sleeve forces the latching members inwardly to the unlatched position.

REFERENCES:
patent: Re28328 (1975-02-01), Williams
patent: 2939728 (1960-06-01), Bitel
patent: 2983978 (1961-05-01), Williams
patent: 3505635 (1970-04-01), Williams
patent: 4174146 (1979-11-01), Williams
patent: 4355854 (1982-10-01), Williams
patent: 4364624 (1982-12-01), Williams
patent: 4422704 (1983-12-01), Williams
patent: 4525016 (1985-06-01), Williams
patent: 4602123 (1986-07-01), Williams

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