Test probe accessibility method and tool

Details Test probe accessibility method and tool Test probe accessibility method and tool

1987-10-30

1989-06-20

Eisenzopf, Reinhard J.

Electricity: measuring and testing

Plural, automatically sequential tests

324 725, 324149, 324158F, 324158P, G01R 104, G01R 3102

Patent

active

048412317

ABSTRACT:
A method and tool for use with "bed of nails" fixturized automatic test equipment for printed circuit cards for verifying the continuity of component pins with the test nails of the system where the pins of the component are not accessible from the component side of the card. A tool is affixed beneath the component to short out all of the pins thereof and a node accessible from the component side of the board that makes contact with one or more of the pins of the component (such as power or ground) is probed with the continuity probe of the system while a continuity test is performed with respect to each of the test nails associated with the pins and nodes of the component.

REFERENCES:
patent: 3870953 (1975-03-01), Boatman et al.
patent: 4055806 (1977-10-01), Patel
patent: 4242633 (1980-12-01), Tissot
patent: 4328264 (1982-05-01), Johns et al.
patent: 4348636 (1982-09-01), Soundoulakis
patent: 4621232 (1986-11-01), Chang et al.
"Contact Probe Assembly with a Retractable Shorting Center", by Faure, IBM Tech. Disc. Bull., vol. 19, #4, 9/76, pp. 1267-1268.

Affiliated with

Also associated with

Rating

Test probe accessibility method and tool does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Test probe accessibility method and tool, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Test probe accessibility method and tool will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-527387