Test probe

Details Test probe Test probe

2011-05-03

2011-05-03

Nguyen, Ha Tran T (Department: 2858)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S754030, C324S755010, C324S756070, C257S048000

Reexamination Certificate

active

07936178

ABSTRACT:
A test probe is provided. The test probe includes a group of shielding boards and two probe pins. The group of shielding boards has two opposite surfaces. The group of shielding boards includes at least two insulation boards and at least one metal board. The metal board is formed between the two insulation boards. The two probe pins are formed on the two surfaces of the group of shielding boards and have a distance between each other.

REFERENCES:
patent: 4480223 (1984-10-01), Aigo
patent: 4678865 (1987-07-01), Sherwin
patent: 5175493 (1992-12-01), Langgard
patent: 5196789 (1993-03-01), Golden et al.
patent: 5512838 (1996-04-01), Roach
patent: 5557214 (1996-09-01), Barnett
patent: 2009/0224781 (2009-09-01), Aoyagi et al.

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