Test prepared RF integrated circuit

Details Test prepared RF integrated circuit Test prepared RF integrated circuit

2006-03-27

2010-06-15

Wachsman, Hal D (Department: 2857)

Data processing: measuring, calibrating, or testing

Testing system

Of circuit

C702S117000, C702S124000, C702S126000, C324S765010

Reexamination Certificate

active

07739069

ABSTRACT:
In an example embodiment, an integrated circuit comprises a mixer circuit and a local oscillator circuit. During testing a frequency divider circuit in the integrated circuit divides a local oscillator signal to a frequency below a normal operating range of the local oscillator. The integrated circuit applies the divided local oscillator signal to the mixer circuit instead of the local oscillator signal during testing. Signal properties of a signal derived from the mixer circuit are measured while the divided local oscillator signal is applied to the mixer circuit.

REFERENCES:
patent: 4219770 (1980-08-01), Weinert
patent: 6400188 (2002-06-01), Baker et al.
patent: 2002/0170003 (2002-11-01), Hirabayashi
patent: 2003/0048142 (2003-03-01), Albean
patent: 2003/0097614 (2003-05-01), Rajski et al.
patent: 2004/0019449 (2004-01-01), Espinoza et al.
patent: 2006/0111072 (2006-05-01), Kerth et al.
R. Nelson “RF Test Join Soc Ate” Test and Measurement World, Apr. 1, 2002.

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