Test point adapter for chip carrier sockets

Details Test point adapter for chip carrier sockets Test point adapter for chip carrier sockets

1988-05-26

1989-08-29

Karlsen, Ernest F.

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

324 73PC, 439 68, G01R 3102, H01R 2372

Patent

active

048620769

ABSTRACT:
This arrangement provides for attaching test or probe leads for such instruments as a logic analyzer to a leaded chip carrier. This arrangement provides for terminating each chip carrier lead to a metallic post upon which a logic probe or other test apparatus may be mechanically attached to make electrical connection. Since leaded chip carriers have their contact leads closely spaced, this arrangement expands this distance between leads to a suitable distance for connecting test probes. In this manner, the semiconductor chip may be functionally tested as part of a circuit on a printed wiring card.

REFERENCES:
patent: 4536955 (1985-08-01), Gudgeon

Affiliated with

Also associated with

Rating

Test point adapter for chip carrier sockets does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Test point adapter for chip carrier sockets, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Test point adapter for chip carrier sockets will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-2240850