Thermal measuring and testing – Thermal calibration system – By thermal radiation emitting device
Patent
1983-12-01
1985-10-29
Yasich, Daniel M.
Thermal measuring and testing
Thermal calibration system
By thermal radiation emitting device
2502521, G01D 1800
Patent
active
045498148
ABSTRACT:
A thermal test pattern comprises motifs of a material having a high thermal emissivity which are provided on one side of a flat substrate. The substrate has a low thermal emissivity. The other side of the substrate is covered with a layer of a material having a high electrical resistivity which is provided between two conductive connection strips. The motifs and connection strips and resistive layer may be deposited by silk screening. Due to the differences in thermal emissivity, a temperature difference occurs between the substrate and the motifs, the motifs being colder, when the substrate is heated by passing an electric current through the resistive layer.
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Creel Georges N.
Morelle Claude
Schechter Marc D.
U.S. Philips Corporation
Yasich Daniel M.
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