Test pin for an adapter for connecting test contacts on the grid

Details Test pin for an adapter for connecting test contacts on the grid Test pin for an adapter for connecting test contacts on the grid

1987-11-16

1990-01-23

Eisenzopf, Reinhard J.

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

324158F, 324 725, G01R 100, G01R 104

Patent

active

048961078

ABSTRACT:
A test pin for an adapter for connecting test contacts of a printed circuit board testing device that are located on a grid with test points of a test-piece such as a printed circuit board located on and/or off the grid, wherein in order to connect associated test contacts and test points the test pin can be inserted into guide holes at different inclinations in the adapter and has a pointed contact section that is directed towards the respective contact point of the circuit board and projects from the adapter and an adjacent guidance section that is guided in the associated guide hole of the adapter, is designed so that test-pieces with their test points only a relatively short distance apart can be tested. This is achieved by reducing the cross-section of the guidance section conically or stepwise towards the contact section.

REFERENCES:
"Taper-Lock Probing Device", by Dopp et al., IBM Tech. Disc. Bull., vol. 13, #9, 2/71, pp. 2613.
"Spring Test Probe", by Barnum, IBM Tech. Disc. Bull., 12/73, pp. 2167-2168, vol. 16, #7.
"Twin Contact Multiple Connector", by Bohannon, Western Electric, 4/71, #22, pp. 9-10.
Ingun Prumitted bau Konstanz, "Adapter Und Zubehor VA-Katalog", Feb. 1985 (in German).
"Probe-to-Coupling Block Pressure Contact with Dust Seal", by Faure et al., IBM Tech. Disc. Bull., vol. 18, No. 3, 8/75, p. 701.

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