Measuring and testing – Sampler – sample handling – etc.
Reexamination Certificate
2007-12-13
2010-02-16
Raevis, Robert R (Department: 2856)
Measuring and testing
Sampler, sample handling, etc.
Reexamination Certificate
active
07661325
ABSTRACT:
A test piece attachment apparatus includes a test piece magazine having an inner space storing a plurality of specimen component test pieces aligned in a predetermined direction and a feed outlet via which the specimen component test pieces can be successively extruded, a magazine holder exchangeably holding the test piece magazine, a torsion spring generating a bias force to press the specimen component test pieces aligned in the test piece magazine toward the feed outlet, and a cylindrical casing. The cylindrical casing includes a recessed groove that allows the magazine holder to move in its axial direction and an extrusion projection disposed at a position where the extrusion projection can push one specimen component test piece positioned at the feed outlet and can extrude the specimen component test piece out of the test piece magazine in accordance with a movement of the magazine holder.
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Notice of Grounds for Rejection for Japanese Patent Application No. 2006-157603 mailed Apr. 28, 2009 with English translation.
Cantor & Colburn LLP
Raevis Robert R
Sousei Electronics Corporation
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