Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Reexamination Certificate
2011-04-12
2011-04-12
Nguyen, Vincent Q (Department: 2858)
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
C324S658000
Reexamination Certificate
active
07924030
ABSTRACT:
Disclosed is a test pattern for analyzing capacitances of interconnection lines that accounts for parasitic capacitance components. The test pattern includes a first metal line having a comb-type structure including a plurality of tines, a second metal line having a comb-type structure including a plurality of tines engaged with the tines of the first metal line, a first probe pad switchably connected to the first metal line, and a second probe pad switchably connected to the second metal line. Switchable connections between the first metal line and the first probe pad and between the second metal line and the second probe pad may be provided by first and second switch terminals, respectively. The test pattern enables a capacitance measurement that accounts for parasitic capacitance components of pads and portions of interconnection lines leading from the pads, which otherwise interfere with accurate measurement of capacitances of the interconnection lines.
REFERENCES:
patent: 6870387 (2005-03-01), Huang et al.
patent: 2003/0071641 (2003-04-01), Armbruster
Dongbu Hi-Tek Co., Ltd.
Nguyen Vincent Q
Workman Nydegger
LandOfFree
Test pattern for analyzing capacitance of interconnection line does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Test pattern for analyzing capacitance of interconnection line, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Test pattern for analyzing capacitance of interconnection line will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-2736438