Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Reexamination Certificate
2011-03-22
2011-03-22
Nguyen, Hoai-An D (Department: 2858)
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
C073S104000
Reexamination Certificate
active
07911215
ABSTRACT:
A test system for taking a sample of a constituent on a surface utilizing a fluid source includes a transition region having a capillary layer for delivering a fluid from said fluid source, an extraction region having a collection material in contact with said surface, and a collection region having a sensor reservoir therein for collecting the fluid for analysis.
REFERENCES:
patent: 3800219 (1974-03-01), Fosberg
patent: 4597942 (1986-07-01), Meathrel
patent: 4719441 (1988-01-01), Horn
patent: D342321 (1993-12-01), Bresle
patent: 5888758 (1999-03-01), Wu
patent: 5942186 (1999-08-01), Sanada et al.
patent: 5958340 (1999-09-01), Meyer et al.
patent: 6090475 (2000-07-01), Robinson et al.
patent: 6159743 (2000-12-01), Johnson et al.
patent: 6425997 (2002-07-01), Johnson
patent: 6501002 (2002-12-01), Roe et al.
patent: 6551837 (2003-04-01), Johnson et al.
patent: 6636031 (2003-10-01), Kenmochi et al.
patent: 6819120 (2004-11-01), Tam
patent: 6828808 (2004-12-01), Srinivasan et al.
patent: 6843354 (2005-01-01), Dittmer et al.
patent: 6946844 (2005-09-01), Colahan et al.
patent: 7024921 (2006-04-01), Sutton
patent: 7308822 (2007-12-01), Sutton
patent: 2003/0040682 (2003-02-01), Tapper
patent: 350777 (1972-11-01), None
Angal Jayant
Gossen Paul
Musho Matthew K.
Yates Joseph E.
Brackett Alexander P.
Innovative Productivity, Inc.
Middleton & Reutlinger
Nguyen Hoai-An D
LandOfFree
Test patch system and method does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Test patch system and method, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Test patch system and method will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-2621586