Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Patent
1994-02-10
1995-08-22
Nguyen, Vinh
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
324755, G01R 3100
Patent
active
054443873
ABSTRACT:
Integrated circuit (IC) packages mounted on a loaded printed circuit board (PCB) are tested by a translator module by first placing a corresponding module over each package. Each module has rows of spring contacts for releasably contacting corresponding electrical leads adjacent opposite sides of the IC package. An upper surface of the module has an array of electrically conductive test pads internally connected to corresponding contacts on the module. The test pads match an array of spring probes in the test unit. The module can be a molded plastic housing with metal leaf spring contacts, or it can comprise a composite flex-circuit material with individual contacts comprising flexible spring-like metalized plastic fingers. Contacts on the test module can releasably engage the leads on the IC package directly, or they can contact separate conductive leads on the PCB adjacent the leads on the IC package. During testing, the spring probes contact the test pads on the test modules and circuit continuity is established via the electrical connections from the spring probes through the modules to the leads adjacent the IC packages. The modules translate dense in-line spacing of leads adjacent the IC packages to the oversized in-line spacing of test pads on the module. In another embodiment, the translator module is attached to a flex-circuit cable coupled to the test system electronics. The translator module is manually placed over each IC package during testing. In a further embodiment, an integrated circuit package contains a built-in test verifier system so that standard test probes can be used to test the package without use of a separate translator module.
REFERENCES:
patent: 3239798 (1966-03-01), Silver
patent: 3506949 (1970-04-01), Venaleck et al.
patent: 3573617 (1972-10-01), Randolph et al.
patent: 3701077 (1972-10-01), Kelly, Jr.
patent: 4138186 (1979-02-01), Long et al.
patent: 4541676 (1985-09-01), Hansen et al.
patent: 4564251 (1986-01-01), Hansen et al.
patent: 4671590 (1987-06-01), Ignasiak
patent: 4749362 (1988-06-01), Hoffman et al.
patent: 4768972 (1988-09-01), Ignasiak et al.
patent: 4833404 (1989-05-01), Meyer et al.
patent: 4835469 (1989-05-01), Jones et al.
patent: 4996476 (1991-02-01), Balyasny et al.
patent: 5208529 (1993-05-01), Tsurishima et al.
RIM Electronic Handbook, 1985 (3 pages).
Johnston Charles J.
Swart Mark A.
Van Loan David R.
Everett Charles Technologies, Inc.
Nguyen Vinh
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