Test mode power circuit for integrated-circuit chip

Details Test mode power circuit for integrated-circuit chip Test mode power circuit for integrated-circuit chip

1997-08-06

1998-11-24

Riley, Shawn

Electricity: power supply or regulation systems

Self-regulating

Using a three or more terminal semiconductive device as the...

323353, 323298, G05F 316

Patent

active

058412719

ABSTRACT:
A power supply circuit for an integrated-circuits chip includes variable resistors for establishing an internal voltage for the chip. The internal voltage is variable with the variable resistors and compared by a comparator to a test voltage supplied from an external test circuit. A first buffer amplifier, powered by an externally supplied voltage, amplifies the output of the comparator to produce output voltages of opposite polarities. A second buffer amplifier, powered by the externally supplied voltage, amplifies the output voltages of the first buffer amplifier to supply an output voltage to the test circuit. In a modified embodiment, a second voltage source is additionally provided to establish a second internal voltage higher than the internal voltage produced by the first reference voltage source. The first buffer amplifier is powered by the second internal voltage, instead of by the first internal voltage, to amplify the output of the comparator.

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