Excavating
Patent
1995-08-07
1998-03-03
Beausoliel, Jr., Robert W.
Excavating
371 226, 307407, 3241581, G06F 1100, H03K 1780
Patent
active
057245029
ABSTRACT:
A test mode matrix circuit in an integrated circuit switches signal lines internal to the integrated circuit in a manner that allows an embedded microprocessor within the integrated circuit to be fully functionally tested using standard test vectors applied to the integrated circuit, and which allows for debugging the code written for an embedded microprocessor core by connecting an in-circuit emulator (ICE) to the integrated circuit. The test mode matrix circuit operates in a number of mutually exclusive modes, each of which is suitably selected via control signal inputs to the test mode matrix. The test mode matrix circuit couples signals from the embedded microprocessor to the application-specific logic without passing through off-chip drivers/receivers. Multiple microprocessors and corresponding test mode matrices may also be implemented on the same integrated circuit.
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Cherichetti Cory Ansel
Colyer Peter Stewart
Stauffer David Robert
Beausoliel, Jr. Robert W.
International Business Machines - Corporation
Le Dieu-Minh
Walsh Robert A.
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