Test mode control circuit of an integrated circuit device

Details Test mode control circuit of an integrated circuit device Test mode control circuit of an integrated circuit device

1994-07-29

1999-11-09

Nguyen, Vinh P.

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

324 225, G01R 1512, G06F 1100

Patent

active

059821884

ABSTRACT:
According to the present invention, entry into the test mode of an integrated circuit device is possible even when there is no device pin dedicated to a test mode function. Test mode control circuitry allows a pin of the integrated circuit device to be double mapped to a normal operation function and to a test mode function. The test mode control circuitry has a polarity circuit having a polarity bond pad and a fuse circuit having a fuse element, either of which may determine when the polarity of the pin is representative of a test mode function. Either down-bonding the polarity bond pad to the lead frame of the integrated circuit device or blowing the fuse renders the pin representative of the test mode function. Additionally, once the test mode of the device is entered, the device may be adequately stress tested. Holding an external clock signal of the integrated circuit device to a given logic state ensures that the device is stress tested for the duration of time the external clock signal is held to the given logic state.

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