Test mode and test method for a temperature tamper detection...

Details Test mode and test method for a temperature tamper detection... Test mode and test method for a temperature tamper detection...

2006-06-23

2008-10-28

Nguyen, Vincent Q (Department: 2831)

Electricity: measuring and testing

Impedance, admittance or other quantities representative of...

Lumped type parameters

C324S685000, C324S721000, C341S127000

Reexamination Certificate

active

07443176

ABSTRACT:
An integrated circuit temperature sensor includes a sensor to determine whether the integrated circuit is currently exposed to a relatively low or high temperature. A measured voltage across the base-emitter of a bipolar transistor is selected if the sensor indicates exposure to the relatively low temperature or, a measured delta voltage across the base-emitter of the bipolar transistor is selected if the sensor indicates exposure to the relatively high temperature. The voltage across the base-emitter is compared against a first reference for determining exposure to a too cold condition or the selected measured delta voltage across the base-emitter is compared against a second reference for determining exposure to a too hot condition. In a test mode, the measured delta voltage across the base-emitter and/or the measured voltage across the base-emitter are scaled.

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Partial European Search Report for EP 06255928 dated Mar. 14, 2007.

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