Test methods, devices and test kits

Surgery – Diagnostic testing – Monitoring fertility cycle

Reexamination Certificate

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C436S065000

Reexamination Certificate

active

07044919

ABSTRACT:
A method for determining the time of maximum fertility in the mammalian ovulation cycle, for the purpose of assisting conception, wherein testing is conducted over a period of days in the current ovulation cycle on samples of body fluid obtained from an individual human subject to detect an elevated concentration of first analyte, such as luteinising hormone (LH) indicative of the event of ovulation, and additionally testing is conducted over a period of days in the current ovulation cycle on samples of body fluid obtained from the individual subject to detect an elevated concentration of a second analyte, such as estradiol or a metabolite thereof, especially estradiol-3-glucuronide (E3G), to provide advance warning of ovulation.

REFERENCES:
patent: 3141740 (1964-07-01), Wild
patent: 3406015 (1968-10-01), Foster
patent: 3406016 (1968-10-01), Foster et al.
patent: 3434801 (1969-03-01), Scherr
patent: 3436186 (1969-04-01), Mcsweeney et al.
patent: 3749089 (1973-07-01), Derr
patent: 3875013 (1975-04-01), Manautou et al.
patent: 3924609 (1975-12-01), Friedenberg et al.
patent: 3926037 (1975-12-01), Kopito et al.
patent: 3968011 (1976-07-01), Manautou et al.
patent: 3986494 (1976-10-01), Preti et al.
patent: 3991174 (1976-11-01), Grundman
patent: 4002056 (1977-01-01), Kopito et al.
patent: 4010738 (1977-03-01), Preti et al.
patent: 4013066 (1977-03-01), Schuster
patent: 4031365 (1977-06-01), Raggiotti et al.
patent: 4036212 (1977-07-01), Karuhn
patent: 4059986 (1977-11-01), Schuster
patent: 4072045 (1978-02-01), Kopito
patent: 4119089 (1978-10-01), Preti et al.
patent: 4123510 (1978-10-01), Banik et al.
patent: 4148304 (1979-04-01), Mull
patent: 4151831 (1979-05-01), Lester
patent: 4151833 (1979-05-01), Polishuk
patent: 4208187 (1980-06-01), Givner
patent: 4232215 (1980-11-01), Hanley
patent: 4246907 (1981-01-01), Bullock
patent: 4261371 (1981-04-01), Reading, III
patent: 4312360 (1982-01-01), Conway et al.
patent: 4367527 (1983-01-01), Desjacques
patent: 4370727 (1983-01-01), Bellet
patent: 4377171 (1983-03-01), Wada
patent: 4381121 (1983-04-01), Hanley
patent: 4385125 (1983-05-01), Preti et al.
patent: 4396020 (1983-08-01), Wolff et al.
patent: 4408905 (1983-10-01), Ehrenkranz
patent: 4443851 (1984-04-01), Lin
patent: 4450239 (1984-05-01), Chatterton
patent: 4465077 (1984-08-01), Schneider
patent: 4466445 (1984-08-01), Abrams
patent: 4475158 (1984-10-01), Elias
patent: 4488560 (1984-12-01), Takamura
patent: 4498481 (1985-02-01), Lemke
patent: 4530366 (1985-07-01), Nessi et al.
patent: 4534362 (1985-08-01), Schumacher et al.
patent: 4557273 (1985-12-01), Stoller et al.
patent: 4614715 (1986-09-01), Tsibris et al.
patent: 4670401 (1987-06-01), Cutler et al.
patent: 4676254 (1987-06-01), Frohn
patent: 4685471 (1987-08-01), Regas et al.
patent: 4691714 (1987-09-01), Wong et al.
patent: 4752880 (1988-06-01), Aeschlimann
patent: 4753247 (1988-06-01), Kirsner
patent: 4770186 (1988-09-01), Regas et al.
patent: 4779627 (1988-10-01), Kosasky
patent: 4921808 (1990-05-01), Schneyer et al.
patent: 4931403 (1990-06-01), Cutler et al.
patent: 5043888 (1991-08-01), Uriarte
patent: 5050612 (1991-09-01), Matsumura
patent: 5063903 (1991-11-01), Wahl et al.
patent: 5091170 (1992-02-01), Navot
patent: 5137028 (1992-08-01), Nishimura
patent: 5209238 (1993-05-01), Sundhar
patent: 5216599 (1993-06-01), Uebe et al.
patent: 5248593 (1993-09-01), Hubner-Parajsz et al.
patent: 5467778 (1995-11-01), Catt et al.
patent: 5657762 (1997-08-01), Coley et al.
patent: 5685319 (1997-11-01), Marett
patent: 5721142 (1998-02-01), Klemm et al.
patent: 5881673 (1999-03-01), Beach et al.
patent: 0703454 (1996-03-01), None
patent: 0754949 (1997-01-01), None
patent: 0833160 (1998-04-01), None
patent: 95 01128 (1995-01-01), None
patent: 95 13543 (1995-05-01), None

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