Test method of memory IC function on device board with...

Details Test method of memory IC function on device board with... Test method of memory IC function on device board with...

2006-01-17

2006-01-17

Barlow, John (Department: 2863)

Data processing: measuring, calibrating, or testing

Testing system

Of circuit

Reexamination Certificate

active

06988046

ABSTRACT:
In a test method of a memory IC function, memory ICs of different types are prepared after a memory tester is prepared. The data related to each test method of these memory ICs is transmitted to the memory tester. Further, after a random number is generated, a test of a predetermined memory IC is executed in reply to the generated random number. It is checked whether the tests of all the memory ICs are finished or not: and the generation of the random number and the execution of the test are repeated when they are not finished, while the processing is finished when they are finished.

REFERENCES:
patent: 4730319 (1988-03-01), David et al.
patent: 5946247 (1999-08-01), Osawa et al.
patent: 2004/0053429 (2004-03-01), Muranaka
Eric Knorr, The PC Bible, 1995, Peachpit Press, 2ndedition, p. 166-167.

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