Test method of embedded capacitor and test system thereof

Details Test method of embedded capacitor and test system thereof Test method of embedded capacitor and test system thereof

2007-12-11

2007-12-11

Barlow, John (Department: 2863)

Data processing: measuring, calibrating, or testing

Testing system

Of circuit

Reexamination Certificate

active

11591381

ABSTRACT:
A test method of an embedded capacitor and test system thereof are provided. The method and system are used to determine an electrical specification of the embedded capacitive component in a circuit board substrate, thereby avoiding executing a follow-up fabricating process for the circuit board substrate not satisfying the desired specification. In the method and system, a geometric size of the embedded capacitor is measured, and a relation value between the electrical parameter and the geometric size and a standard electrical parameter are obtained from a model database, to calculate the electrical parameter of the embedded capacitor. Then, the electrical parameter of the embedded capacitor is compared with the standard electrical parameter, to obtain an error value. Therefore, according to the error value, it may be acquired whether or not the circuit board substrate satisfies set electrical specifications.

REFERENCES:
patent: 5155655 (1992-10-01), Howard et al.
patent: 6068782 (2000-05-01), Brandt et al.
patent: 7019959 (2006-03-01), Chua
patent: 2003/0011380 (2003-01-01), Harzanu et al.
patent: 2003/0147194 (2003-08-01), Hibi et al.

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