Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – With rotor
Patent
1988-03-14
1990-09-04
Eisenzopf, Reinhard J.
Electricity: measuring and testing
Measuring, testing, or sensing electricity, per se
With rotor
324158F, 324454, G01R 3126
Patent
active
049547720
ABSTRACT:
In a test method of an electrostatic breakdown of a semiconductor device in accordance with the present invention, a plurality of semiconductor devices are disposed at random on a member which has been electrostatically charged with a predetermined voltage, and the semiconductor devices are caused to be discharged while being moved on the member. Then, a test is performed to determine whether an electrostatic breakdown occurs in each of semiconductor devices. The electrical characteristics of each semiconductor device are measured after the charged static electricity has been removed. Each semiconductor device to be tested is incorporated in a package and has lead terminals connected to a semiconductor chip.
REFERENCES:
patent: 4806857 (1989-02-01), Inamura et al.
ISTFA: "New ESD Test Method", by Y. Satoh et al., 1986, pp. 91-94.
Eisenzopf Reinhard J.
Mitsubishi Denki & Kabushiki Kaisha
Urban Edward
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