Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2007-09-04
2007-09-04
Karlsen, Ernest (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C324S755090, C324S757020
Reexamination Certificate
active
11152712
ABSTRACT:
A contact system for electrically engaging semiconductor components includes an interface board mountable to an automated test handler, and a floating substrate on the interface board. The interface board includes interface contacts in electrical communication with external test circuitry. The substrate includes flexible segments, and contactors having contact pads on opposing sides of the flexible segments configured to simultaneously electrically engage terminal contacts on the components, and the interface contacts on the interface board. The contact pads include conductive polymer layers that provide an increased compliancy for the contactors. This increased compliancy allows the contactors to accommodate variations in the dimensions and planarity of the terminal contacts on the component. In addition, the substrate includes grooves between the contactors which provide electrical isolation and allow the contactors to move independently of one another. An alternate embodiment contact system includes a Z-axis conductive polymer layer between the substrate and the interface board. Also provided are test methods employing the contact systems.
REFERENCES:
patent: 3767519 (1973-10-01), Kojima et al.
patent: 4528500 (1985-07-01), Lightbody et al.
patent: 4571542 (1986-02-01), Arai
patent: 4574235 (1986-03-01), Kelly et al.
patent: 4707657 (1987-11-01), Boegh-Petersen
patent: 4833402 (1989-05-01), Boegh-Petersen
patent: 4961052 (1990-10-01), Tada et al.
patent: 5109596 (1992-05-01), Driller et al.
patent: 5132058 (1992-07-01), Suyama et al.
patent: 5163834 (1992-11-01), Chapin et al.
patent: 5171290 (1992-12-01), Olla et al.
patent: 5302891 (1994-04-01), Wood et al.
patent: 5317255 (1994-05-01), Suyama et al.
patent: 5371255 (1994-12-01), Mentink et al.
patent: 5492863 (1996-02-01), Higgins, III
patent: 5509203 (1996-04-01), Yamashita
patent: 5574382 (1996-11-01), Kimura
patent: 5670889 (1997-09-01), Okubo et al.
patent: 5798655 (1998-08-01), Kazama et al.
patent: 5894217 (1999-04-01), Igarashi et al.
patent: 5945834 (1999-08-01), Nakata et al.
patent: 6005401 (1999-12-01), Nakata et al.
patent: 6046599 (2000-04-01), Long et al.
patent: 6064217 (2000-05-01), Smith
patent: 6064218 (2000-05-01), Godfrey
patent: 6072324 (2000-06-01), Farnworth
patent: 6091256 (2000-07-01), Long et al.
patent: 6114864 (2000-09-01), Soejima et al.
patent: 6181145 (2001-01-01), Tomita et al.
patent: 6181149 (2001-01-01), Godfrey et al.
patent: 6204681 (2001-03-01), Nagatsuka et al.
patent: 6215321 (2001-04-01), Nakata
patent: 6232791 (2001-05-01), Jitsumori et al.
patent: 6259036 (2001-07-01), Farnworth
patent: 6263566 (2001-07-01), Hembree et al.
patent: 6297652 (2001-10-01), Shimoda et al.
patent: 6297658 (2001-10-01), Nakata et al.
patent: 6329829 (2001-12-01), Farnworth et al.
patent: 6333555 (2001-12-01), Farnworth et al.
patent: 6407563 (2002-06-01), Ohtaki
patent: 6462568 (2002-10-01), Cram
patent: 6483329 (2002-11-01), Cram
patent: 6492599 (2002-12-01), Sugihara
patent: 6518781 (2003-02-01), Masuda
patent: 6529026 (2003-03-01), Farnworth et al.
patent: 6614246 (2003-09-01), Kohno et al.
patent: 6720787 (2004-04-01), Kimura et al.
patent: 6856151 (2005-02-01), Cram
patent: 6939142 (2005-09-01), Maruyama et al.
patent: 7038475 (2006-05-01), Cram
patent: 2001/0040464 (2001-11-01), Tanioka et al.
Gratton Stephen A.
Karlsen Ernest
LandOfFree
Test method for semiconductor components using anisotropic... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Test method for semiconductor components using anisotropic..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Test method for semiconductor components using anisotropic... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3762961