Test method for power integrated devices

Details Test method for power integrated devices Test method for power integrated devices

1995-12-19

1998-09-01

Brock, Michael

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

For fault location

324763, G01R 3128

Patent

active

058015361

ABSTRACT:
A method of checking an integrity of an electric power connection between a contact pad of an integrated circuit and a corresponding contact pin in an electronic power device, wherein the electronic power device includes at least one final power stage powered from the respective discrete contact pad connected by means of the electric power connection to the respective contact pin. The method of checking is accomplished by providing a resistive connection between two contact pads of the electronic power device bringing the at least one final power stage, powered from the first contact pad, to a conduction state, measuring the potential difference between the two contact pins connected to the two contact pads, and comparing the potential difference with a predetermined nominal potential difference.

REFERENCES:
patent: 5521511 (1996-05-01), Lanzi et al.
European Search Report from European Patent Application 94830592.5, filed Dec. 30, 1995.

Affiliated with

Also associated with

Rating

Test method for power integrated devices does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Test method for power integrated devices, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Test method for power integrated devices will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-273127