Test method

X-ray or gamma ray systems or devices – Specific application – Absorption

Reexamination Certificate

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Details

C356S237100

Reexamination Certificate

active

07852982

ABSTRACT:
To provide a method and device for testing the size and conductivity of a foreign material adhered to a substrate for a liquid crystal display device, there is provided a method of testing whether a foreign material including a metal element is adhered to a substrate for a liquid crystal display device, the method including a first test step of detecting the size and position of the foreign material adhered to the substrate and a second test step of testing whether the foreign material includes the metal element at the position detected in the first test step.

REFERENCES:
patent: 6355495 (2002-03-01), Fujino et al.
patent: H03-181848 (1991-08-01), None
patent: H08-075683 (1996-03-01), None
patent: H08-145901 (1996-06-01), None
patent: H11-132720 (1999-05-01), None
patent: H11-316201 (1999-11-01), None
patent: 2000-009661 (2000-01-01), None
patent: 2001-196429 (2001-07-01), None
patent: 2002-257756 (2002-09-01), None
patent: 2003-149183 (2003-05-01), None
patent: 2004-170092 (2004-06-01), None

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