Test machine for testing an integrated circuit with a...

Details Test machine for testing an integrated circuit with a... Test machine for testing an integrated circuit with a...

2006-04-25

2006-04-25

Hoff, Marc S. (Department: 2857)

Data processing: measuring, calibrating, or testing

Testing system

Of circuit

C702S064000, C702S182000, C324S537000

Reexamination Certificate

active

07035749

ABSTRACT:
A test machine (10) is provided with a integrating circuit (102) so that when a integrated circuit (12) is inserted in the test machine an external feedback loop between an input (120a) and an output (124a) of a comparator (122) in the integrated circuit under test is established. Thus an input voltage of the comparator (122) oscillates around a threshold level of the comparator (122). A test result is determined dependent on an average value of an oscillating voltage in the feedback loop. In an embodiment the feedback loop is realized with a digital test tester (100, 104, 106) with an added analog integrating circuit added to its output (14).

REFERENCES:
patent: 4503465 (1985-03-01), Wine
patent: 4564821 (1986-01-01), Reichart
patent: 4807147 (1989-02-01), Halbert et al.
patent: 5629875 (1997-05-01), Adair, Jr.
patent: 5970074 (1999-10-01), Ehiro
patent: 6104968 (2000-08-01), Ananth
patent: 6573762 (2003-06-01), Wessendorf et al.
patent: 56-022974 (1981-03-01), None
patent: 63-234170 (1988-09-01), None

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