Test heads having contact pairs

Details Test heads having contact pairs Test heads having contact pairs

1979-11-29

1981-08-18

Desmond, Eugene F.

Geometrical instruments

29882, 29883, 29884, 339218M, H01R 1362

Patent

active

042843146

ABSTRACT:
A test head 90 having a plurality of contact pairs 81 is formed in a simple monolithic manner. A plurality of first conductors 74 are aligned in a first row and, spaced therefrom, a plurality of second conductors 80 are aligned in a second row. Each conductor has a circuit end and a contact end and each first conductor 74 registers with a mating second conductor 80 to form a plurality of contact pairs 81 at the contact ends.
A common base insulator 88 is formed transversely of the conductors 74 and 80 at the circuit ends to maintain conductor spacing in an electrically insulated manner. A common bar insulator 86 is formed transversely of the second conductors 80 to maintain the contact spacing within the pairs 81 when the conductors are flexed toward a device 27 to be tested.
In a method of making a test head 90, the conductors are made in patterns 56 from sheet 55 having a substantially uniform metallurgical composition and each pattern 56 includes a member 72 connected to the circuit ends of the conductors. After assembly, the connective member 72 is removed; therefore the position of each conductor relative to other conductors in a pattern 56 is maintained constant from the sheet 55 to the test head 90. The sheet 55 is advantageously made from a beryllium copper alloy which is susceptible to precipitation aging for hardness to obtain spring temper.

REFERENCES:
patent: 3573617 (1971-04-01), Randolph
patent: 3618207 (1971-11-01), Sand et al.
patent: 3715662 (1973-02-01), Richelman
patent: 3728607 (1973-04-01), Richelman
patent: 3848221 (1979-11-01), Lee
patent: 4068170 (1978-01-01), Chayka et al.
patent: 4090293 (1978-05-01), van der Donk et al.
Multipoint Test Probe, Wood et al., IBM Technical Disclosure Bull. vol. 18, No. 8, Jan. 1976, pp. 2453-2454.

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