Test head of an IC test device

Details Test head of an IC test device Test head of an IC test device

1997-12-24

2000-06-13

Ballato, Josie

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

324763, G01R 3102

Patent

active

060753749

ABSTRACT:
A test head of an IC test device is provided for eliminating reflection of a high frequency test pattern signal to enhance measuring accuracy by relaying a measuring line extending from a driver.comparator circuit to a terminating resistor by way of a DUT without interposing a through hole. The test head of an IC test device comprises a first pin card, a second pin card and a DUT board, wherein a measuring line extending from the driver.comparator circuit mounted on the first pin card to the terminating resistor mounted on the second pin card by way of a DUT is relayed by a conductive pattern provided on the DUT board.

REFERENCES:
patent: 5146161 (1992-09-01), Kiser

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