Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Patent
1996-05-14
1998-04-28
Karlsen, Ernest F.
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
324754, 324757, G01R 3102
Patent
active
057449740
ABSTRACT:
An interface assembly in the present invention includes a plate for mounting a test head, a plurality of alignment pins for aligning the test head to a device including a plurality of compressible pins, and a plurality of vacuum-activated components for coupling the plate to the device. After the test head is positioned in operative relation to the other device, the vacuum-activated components provide a vacuum which draws the plate and the device together. The interface assembly eliminates the purely mechanical securing of the plate to the device, thereby minimizing any rocking of the test head and ensuring equal compression of the plurality of compressible pins. The interface assembly also ensures safe user operation by providing that any obstacle (such as a user's finger) between the interface assembly and the device prevents creation of a vacuum. Thus, the present invention provides a time-efficient, reliable, safety-conscious means for positioning a test head relative to another device.
REFERENCES:
patent: 4164704 (1979-08-01), Keto et al.
patent: 4352061 (1982-09-01), Matrone
patent: 4357062 (1982-11-01), Everett
patent: 4527942 (1985-07-01), Smith
patent: 4588346 (1986-05-01), Smith
patent: 4589815 (1986-05-01), Smith
patent: 4625164 (1986-11-01), Golder et al.
patent: 4636723 (1987-01-01), Coffin
patent: 4715574 (1987-12-01), Holt et al.
patent: 4746861 (1988-05-01), Nesbitt
patent: 4771234 (1988-09-01), Cook et al.
patent: 4841231 (1989-06-01), Angelucci
patent: 5148103 (1992-09-01), Pasiecznik, Jr.
patent: 5150042 (1992-09-01), Look et al.
patent: 5500606 (1996-03-01), Holmes
inTEST, "The inTest Handbook, A Guide to Test Head Positioning and Interfacing", Revision 4.0, available from inTEST Corporation, Western U.S. Office, Suite A, 1030 E. Duane Avenue, Sunnyvale, CA 94086, Copyright 1992 (month unavailable).
inTEST Brochure, "in2 Test Head Positioner", available from inTEST Corporation, Western U.S. Office, Suite A, 1030 E. Duane Avenue, Sunnyvale, CA 94086 (date not available).
Bever Patrick T.
Harms Jeanette S.
Karlsen Ernest F.
Kobert Russell M.
Xilinx , Inc.
LandOfFree
Test head interface with vacuum-activated interconnection compon does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Test head interface with vacuum-activated interconnection compon, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Test head interface with vacuum-activated interconnection compon will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-1535777