Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
Reexamination Certificate
2007-11-06
2007-11-06
Chowdhury, Tarifur (Department: 2886)
Optics: measuring and testing
Inspection of flaws or impurities
Surface condition
Reexamination Certificate
active
11113261
ABSTRACT:
An optical test head comprises a laser source for providing a laser beam. The laser beam passes through a cylindrical lens for modifying the shape of the beam and a spherical lens for concentrating the beam onto a workpiece (typically a magnetic disk platter). The cylindrical lens both a) elongates the laser beam along the radial direction of the platter (by reducing the effective numerical aperture in the radial direction); and b) causes the beam to be out of focus in the radial direction (although the beam is typically in focus in the circumferential direction). The size of the beam in the radial direction is substantially insensitive to the position of the cylindrical lens.
REFERENCES:
patent: 3917414 (1975-11-01), Geis et al.
patent: 4794264 (1988-12-01), Quackenbos et al.
patent: 4794265 (1988-12-01), Quackenbos et al.
patent: 4978861 (1990-12-01), Sabater et al.
patent: 5164603 (1992-11-01), Hartman et al.
patent: 5339300 (1994-08-01), Akatsuka et al.
patent: 5471298 (1995-11-01), Moriya
patent: 5719840 (1998-02-01), Jann
patent: 5875029 (1999-02-01), Jann et al.
patent: 6292259 (2001-09-01), Fossey et al.
patent: 6515745 (2003-02-01), Vurens et al.
patent: 6548821 (2003-04-01), Treves et al.
patent: 6566674 (2003-05-01), Treves et al.
patent: 6678043 (2004-01-01), Vurens et al.
patent: 6829047 (2004-12-01), Fujii et al.
U.S. Appl. No. 11/113,258, entitled “Test Head for Optically Inspecting Workpieces”, filed Apr. 23, 2005.
U.S. Appl. No. 11/113,260, entitled “Method and Apparatus for Selectively Providing Data from a Test Head to a Processor”, filed Apr. 23, 2005.
U.S. Appl. No. 11/112,172, entitled “Test Head for Optically Inspecting Workpieces”, filed Apr. 22, 2005.
U.S. Appl. No. 11/112,190, entitled “Robotic System for Optically Inspecting Workpieces”, filed Apr. 22, 2005.
U.S. Appl. No. 11/112,044, entitled “Method and Apparatus for Reducing or Eliminating Stray Light in an Optical Test Head”, filed Apr. 22, 2005.
U.S. Appl. No. 11/112,536, entitled “Test Head for Optically Inspecting Workpieces”, filed Apr. 22, 2005.
U.S. Appl. No. 11/112,909, entitled “Circularly Polarized Light for Optically Inspecting Workpeices”, filed Apr. 22, 2005.
O'Dell Thomas A.
Treves David
Akanbi Isiaka O
Chowdhury Tarifur
Komag, Inc.
LandOfFree
Test head for optically inspecting workpieces comprising a... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Test head for optically inspecting workpieces comprising a..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Test head for optically inspecting workpieces comprising a... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3874285