Test head for microstructures with interface

Details Test head for microstructures with interface Test head for microstructures with interface

1998-11-05

2000-11-21

Metjahic, Safet

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

324754, G01R 3102

Patent

active

061508306

ABSTRACT:
A test head for making contact with test points arranged close to one another of an electric component. The test head having a plurality of contact elements which can be connected to a connecting element of a test device. The contact elements are in respective feed-through openings through two or three overlying guide panels. The contact elements are axially guidable in the feed-through openings in the panel. Various ways of securing the contact elements against falling out of the test head are provided, including friction locking of the contact elements in one panel, using a securing layer at one panel, laterally offsetting one panel with respect to the others, or by different diameters along the length of the contact element, e.g. by insulation selectively applied along the length. The connecting element and the device for making contact are detachably connected.

REFERENCES:
patent: 4622514 (1986-11-01), Lewis
patent: 4901013 (1990-02-01), Bendetto et al.
patent: 5399982 (1995-03-01), Driller et al.
patent: 5493230 (1996-02-01), Swart et al.

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