Test head for integrated circuit tester

Details Test head for integrated circuit tester Test head for integrated circuit tester

2006-03-28

2006-03-28

Nguyen, Vinh (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S754090, C324S1540PB

Reexamination Certificate

active

07019546

ABSTRACT:
A test head for a semiconductor integrated circuit tester includes first and second card cages and first and second groups of interface connectors for engagement by DUT edges of pin electronics cards installed in the first and second card cages respectively. The interface connectors of the first group are inclined at an angle less than 180° to the interface connectors of the second group.

REFERENCES:
patent: 5952842 (1999-09-01), Fujimoto
patent: 6462532 (2002-10-01), Smith

Affiliated with

Also associated with

Rating

Test head for integrated circuit tester does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Test head for integrated circuit tester, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Test head for integrated circuit tester will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3534368