Test head for IC tester

Details Test head for IC tester Test head for IC tester

1997-08-19

1999-08-10

Ballato, Josie

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

324537, G01R 3126, H01L 2166

Patent

active

059364173

ABSTRACT:
To provide a test head for an IC tester wherein identical test signals can be distributed to a plurality of devices to be tested while holding in check an increase in the number of signal lines connecting a waveform shaper to the test head, upsizing of the test head, and an increase in power consumption. A plurality of pin-electronics-cards are connected with each other via a printed wiring pattern on a back board provided inside a test head, a waveform signal shaped at a waveform shaper is received by a receiver card provided in the test head and the waveform signal delivered from the receiver card is distributed to the plurality of the pin-electronics-cards via the printed wiring pattern provided on the back board while the end of the printed wiring pattern is terminated at the termination card.

REFERENCES:
patent: 4517512 (1985-05-01), Petrich et al.
patent: 4862075 (1989-08-01), Choi et al.
patent: 5101153 (1992-03-01), Morong, III
patent: 5216361 (1993-06-01), Akar et al.
patent: 5635846 (1997-06-01), Beaman et al.

Affiliated with

Also associated with

Rating

Test head for IC tester does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Test head for IC tester, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Test head for IC tester will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-1123500