Test head docking system and method

Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – With rotor

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C324S758010

Reexamination Certificate

active

07466122

ABSTRACT:
A system for docking an electronic test head with a handling apparatus is provided. The system includes an assembly for at least partially aligning and subsequently bringing together the electronic test head and the handling apparatus. The system also includes a power driven actuator for providing only partially powered assistance in bringing together the electronic test head and the handling apparatus.

REFERENCES:
patent: 4589815 (1986-05-01), Smith
patent: 4705447 (1987-11-01), Smith
patent: 4715574 (1987-12-01), Holt et al.
patent: 4893074 (1990-01-01), Holt et al.
patent: 5030869 (1991-07-01), Holt et al.
patent: 5440943 (1995-08-01), Holt et al.
patent: 5450766 (1995-09-01), Holt
patent: 5600258 (1997-02-01), Graham
patent: 5600285 (1997-02-01), Sachs et al.
patent: 5608334 (1997-03-01), Holt
patent: 5654631 (1997-08-01), Ames
patent: 5678944 (1997-10-01), Slocum et al.
patent: 5744974 (1998-04-01), Bogden
patent: 5821764 (1998-10-01), Slocum et al.
patent: 5900736 (1999-05-01), Sovik et al.
patent: 5931048 (1999-08-01), Slocum et al.
patent: 5949002 (1999-09-01), Alden
patent: 5982182 (1999-11-01), Chiu et al.
patent: 6043667 (2000-03-01), Cadwallader et al.
patent: 6057695 (2000-05-01), Holt et al.
patent: 6104202 (2000-08-01), Slocum et al.
patent: 6407541 (2002-06-01), Hannan et al.
patent: 6897645 (2005-05-01), bin Mohamed Hassan
patent: WO 02/39127 (2002-05-01), None
A. H. Slocum: “Kinematic couplings for precision fixturing—Part 1: Formulation of design parameters”—Precision Engineering, Apr. 1988 vol. 10, No. 2, pp. 85-91.
International Search Report for PCT Application PCT/US02/22193, mailed Feb. 21, 2003.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Test head docking system and method does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Test head docking system and method, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Test head docking system and method will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-4050754

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.