Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2006-09-19
2006-09-19
Nguyen, Vinh P. (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C324S1540PB
Reexamination Certificate
active
07109733
ABSTRACT:
A system for docking an electronic test head with a handling apparatus is provided. The system includes an assembly for at least partially aligning and subsequently bringing together the electronic test head and the handling apparatus. The system also includes a power driven actuator for providing only partially powered assistance in bringing together the electronic test head and the handling apparatus.
REFERENCES:
patent: 4589815 (1986-05-01), Smith
patent: 4705447 (1987-11-01), Smith
patent: 4715574 (1987-12-01), Holt et al.
patent: 4893074 (1990-01-01), Holt et al.
patent: 5030869 (1991-07-01), Holt et al.
patent: 5450766 (1995-09-01), Holt
patent: 5600258 (1997-02-01), Graham et al.
patent: 5600285 (1997-02-01), Sachs et al.
patent: 5608334 (1997-03-01), Holt
patent: 5654631 (1997-08-01), Ames
patent: 5678944 (1997-10-01), Slocum et al.
patent: 5744974 (1998-04-01), Bogden
patent: 5821764 (1998-10-01), Slocum et al.
patent: 5900736 (1999-05-01), Sovik et al.
patent: 5931048 (1999-08-01), Slocum et al.
patent: 5949002 (1999-09-01), Alden
patent: 5982182 (1999-11-01), Chiu et al.
patent: 6043667 (2000-03-01), Cadwallader et al.
patent: 6057695 (2000-05-01), Holt et al.
patent: 6104202 (2000-08-01), Slocum et al.
patent: 6407541 (2002-06-01), Hannan et al.
patent: 6617867 (2003-09-01), Bruno et al.
patent: WO 02/39127 (2002-05-01), None
A. H. Slocum: “Kinematic couplings for precision fixturing—part 1: Formulation of design parameters”—Precision Engineering, Apr. 1988 vol. 10, No. 2, pp. 85-91.
International Search Report for PCT Application PCT/US02/22193, mailed Feb. 21, 2003.
Gudin Naum
Holt Alyn R.
Ny Nils O.
Weilerstein I. Marvin
West Christopher L.
inTEST Corporation
Nguyen Vinh P.
RatnerPrestia
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