Test handler having size-changeable test site

Details Test handler having size-changeable test site Test handler having size-changeable test site

2009-10-06

2010-10-19

Nguyen, Ha Tran T (Department: 2829)

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

C324S765010

Reexamination Certificate

active

07816910

ABSTRACT:
A test handler (122) of the present invention includes a main body, a window (142) formed on a surface of the main body and having a size corresponding to a Hi-Fix board of M×N array (where M and N represent an integer greater than a value of =), a cover (170) detachably fixed to the main body t close a part of the window and convert the window into the test site having a size corresponding to a [M−A)×(n−B)] Hi-Fix board (where A is an integer equal to or greater than 0 but smaller than M, and B is an integer having a value other than 0). In the test handler, the size of window is easily modified to adapt that of the Hi-Fix board of M×N array by closing or opening a part of the window using the cover. Therefore, the test handler is capable of applying Hi-Fix boards having different sizes.

REFERENCES:
patent: 6703852 (2004-03-01), Feltner
patent: 7667453 (2010-02-01), Shim et al.
patent: 2008/0253869 (2008-10-01), Yun Sung et al.
patent: 2009/0153168 (2009-06-01), Beom et al.
Invalidations of Registration of KR Patent No. 10-532626 (Patent Court Div. 3 & Supreme Court of KR Div. 1 Judgments).

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